For solid interface characterisation we use methods, such as QCM, ellipsometry and SFM. Liquid interfaces and thin films are investigated using the thin film pressure balance technique, AFM and tensiometric methods. We operate specialized labs providing scanning-force techniques for surface imaging and force measurements in different environments and the characterisation of foams and thin liquid films.

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AFM Lab

Our AFM laboratory specialises both on force measurements and scanning in air and liquid medium. Hence, we operate several dedicated microscopes with individual features in scanning speed, resolution characteristics and available sample environment cells.

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Light scattering lab

The light scattering instrument consists of an ALV goniometer setup with a Nd:YAG and a tunable Argon laser as light sources.The setup can be used for dynamic and static light scattering in an angle range at each angle between 30° and 110°.

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Foam films lab

In our group, thin films of mixtures of oppositely charged polyelectrolytes / surfactants and catanionic surfactant systems as well as the effect of electrolytes on foam and wetting films are investigated.

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Physical chemistry lab

We are fully equipped for hydro- and microgel synthesis as well as surface and interface preparation and characterisation. Additionally, tensiometric measurements and surface preparations and modifications can be performed under clean room conditions.

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X-ray lab

The scope of our x-ray instruments focuses on the determination of scattering length density (SLD) variations of soft matter at interfaces by means of specular, off-specular x-ray reflectometry (XRR) and grazing incidence small angle x-ray scattering (GI-SAXS).

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Overview poster

AFM instruments

Specifications and applications
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